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21st IEEE European Test Symposium
(ETS'16)
May 23-27, 2016
Amsterdam, The Netherlands
http://www.ets16.nl/


CALL FOR PAPERS

Scope


The EEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuit and system testing. In 2016, ETS will take place in Amsterdam, The Netherlands. It is organized by the Delft University of Technology, which co- sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA). ETS also features a special track on Emerging Test Strategies (ETS2), where new problems and ideas can be discussed in an informal atmosphere. ETS is the major event of the European Test Week that includes TSS (Test Spring School) and fringe workshops.

You are invited to participate and submit your contributions to ETS’16. The areas of interest include (but are not limited to) the following topics:

  • Analog Test
  • ATE Hardware and Software
  • Automatic Test Generation
  • Board Test and Diagnosis
  • Boundary Scan Test
  • Built-In Self-Test (BIST)
  • Current-Based Test
  • Defect-Based Test
  • Delay and Performance Test
  • Dependability and Functional Safety
  • Design for Test (DfT)
  • Design for Manufacturing (DfM)
  • Diagnosis and Silicon Debug
  • Economics of Test
  • Emerging Technologies
  • Failure Analysis
  • Fault Modeling and Simulation
  • Fault Tolerance
  • GPU Test
  • High-Speed I/O Test
  • Low-Power IC Test
  • Memory Test and Repair
  • MEMS Test
  • Microprocessor Test
  • Mixed-Signal Test
  • Multi-/Many-core Processor Test
  • Nanotechnology Test
  • On-line Test
  • Power Issues in Test
  • Reconfigurable System Test
  • Reliability
  • RFTest
  • Security and Trust Issues in Test
  • Self-Repair
  • Sensor Test
  • Signal Integrity Test
  • SiP, Stacked, 3D IC Test
  • SoC Test
  • Soft Errors
  • Standards in Test
  • System Test
  • Test Compression
  • Test Quality
  • Test Synthesis
  • Thermal Issues in Test
  • Validation and Verification
  • Variability Issues in Test
  • Yield Analysis and Enhancement

Submissions

ETS’16 seeks original, unpublished contributions of the following types:

  • Scientific papers for the Formal Proceedings, presenting novel and complete research work
  • Contributions for the special track on Emerging Test Strategies (ETS2)

ETS’16 also seeks proposals for:

  • Panels, embedded tutorials, and other special sessions
  • Vendor presentations focusing on new features of test related products
  • Fringe workshops, to be held on May 26 and 27
  • Fringe meetings, to be held during the European Test Week

ETS'16 will produce electronic formal proceedings - with ISBN number, and to be indexed in the IEEE Xplore digital library and other bibliographical search engines.

Key Dates

Submission of title, abstract, authors: December 7, 2015

Full submission: December 14, 2015

Notification of acceptance: February 12, 2016

Camera-ready manuscript: March 13, 2016  

Additional Information

Said Hamdioui – General Chair

Delft University of Technology Mekelweg 4, 2628 CD, Delft The Netherlands

Tel: +31-(0)15 278 3643 E-Mail: S.Hamdioui@tudelft.nl

 

Giorgio Di Natale – Program Chair

LIRMM – CNRS/University of Montpellier 161 rue Ada, 34095 Montpellier France

Tel: +33 467 41 85 01

E-Mail: giorgio.dinatale@lirmm.fr

Committee

General Chair

  • Said Hamdioui (NL)

General Vice Chairs

  • Maria K. Michael (CY)
  • Bram Kruseman (NL)

Program Chair

  • Giorgio Di Natale (FR)

Program Vice Chair

  • Haralampos Stratigopoulos (FR)

Topic Chairs

  • Rolf Drechsler (DE)
  • Régis Leveugle (FR)
  • Teresa McLaurin (US)
  • Ilia Polian (DE)
  • Ozgur Sinanoglu (AE)
  • Mehdi Tahoori (DE)
  • Jerzy Tyszer (PL)
  • Xiaoqing Wen (JP)
  • Luigi Carro (BR)
  • Krish Chakrabarty (US)
  • Gildas Leger (ES)

ETS2 Co-Chairs

  • Rene Segers (NL)
  • Matteo Sonza Reorda (IT)

Panel Chair

  • Patrick Girard (FR)
  • Ioana Vatajelu (IT)

Embedded Tutorial Chairs

  • Zebo Peng (SE)
  • Paolo Bernardi (IT)

Special Session Chairs

  • Sybille Hellebrand (DE)
  • Saqib Khursheed (UK)

Industrial Relations Chairs

  • Erik Jan Marinissen (BE)
  • Hans Manhaeve (BE)

Publication Chairs

  • Alberto Bosio (FR)
  • Stephan Eggersgluess (DE)

Web chair

  • Mottaqiallah Taouil (NL)

Publicity Chairs

  • Maksim Jenihhin (EE)
  • Qiang Xu (HK)
  • Ioannis Voyiatzis (GR)

Award Chairs

  • Bernd Becker (DE)
  • Adit Singh (US)

ETS Fringe Workshops

  • Lorena Anghel (FR)
  • Michel Renovell (FR)

Regional Liaisons

  • Baker Mohammad (UAE)
  • Riccardo Reis (BR)
  • Nicola Nicolici (CA)
  • Serge Demidenko (NZ)
  • Ashraf Farghaly Salem (EG)
  • Shi-Yu Huang (TW)

TSS (Test Spring School) Chairs

  • Paolo Prinetto (IT)
  • Lorena Anghel (FR)

Steering Committee

  • Paolo Prinetto (IT) – Chair
  • Lorena Anghel (FR)
  • Bernd Becker (DE)
  • Joan Figueras (ES)
  • Patrick Girard (FR)
  • Pete Harrod (UK)
  • Sybille Hellebrand (DE)
  • Hans Manhaeve (BE)
  • Maria K. Michael (CY)
  • Said Hamdioui (NL)
  • Erik Jan Marinissen (BE)
  • Liviu Miclea (RO)
  • Zebo Peng (SE)
  • Michel Renovell (FR)
  • Jochen Rivoir (DE)
  • Matteo Sonza Reorda (IT)
  • Hans-Joachim Wunderlich (DE)
  • Yervant Zorian (US)

For more information, visit us on the web at: http://www.ets16.nl/

The 21st IEEE European Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

PAST CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

TTTC 1ST VICE CHAIR
Chen-Huan CHIANG
Alcatel-Lucent - USA
E-mail chen-huan.chiang@alcatel-lucent.com

SECRETARY
Joan FIGUERAS
Un. Politec. de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

ITC GENERAL CHAIR
Michael Purtell
Intersil
- USA
Tel. +1-408-372-6015
E-mail m.purtell@ieee.org

TEST WEEK COORDINATOR
Yervant ZORIAN
Synopsys, Inc. - USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Paolo BERNARDI

Politecnico di Torino
- Italy
Tel. +39-011-564-7183
E-mail paolo.bernardi@polito.it

STANDARDS
Rohit KAPUR

Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Giorgio DI NATALE
LIRMM - France
Tel. +33-467-41-85-01
E-mail giorgio.dinatale@lirmm.fr

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA
Giorgio DI NATALE
LIRMM - France
Tel. +33-467-41-85-01
E-mail giorgio.dinatale@lirmm.fr

 

PRESIDENT OF BOARD
Yervant ZORIAN
Synopsys, Inc. - USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 2ND VICE CHAIR
Rohit KAPUR

Synopsys, Inc.
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

FINANCE
Chen-Huan CHIANG
Alcatel-Lucent - USA
E-mail chen-huan.chiang@alcatel-lucent.com

IEEE DESIGN & TEST EIC
André IVANOV
U. of British Columbia - Canada
Tel. +1
E-mail ivanov@ece.ubc.ca

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatel-lucent.com

TECHNICAL ACTIVITIES
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39 090 7055
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC
Gumma University - Japan
Tel.+81-277-30-1111
E-mail k-hatayama@el.gunma-u.ac.jp

LATIN AMERICA
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc. - USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com


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